The system has numerous applications for wide range of materials including powders, thin films, bulk, and fluid samples. Qualitative and semi-quantitative analysis of micro-structural features can be carried out. For both geometries, the incident X-ray beam forms an angle with the specimen surface plane. A given instrument may provide a horizontal or vertical /2 geometry or a vertical / geometry. In this work the influence of a straight linear detector on the resolution function in the BraggBrentano focusing geometry is discussed. This usually goes hand in hand with worse resolution and asymmetric peak profiles. In this geometry, both the x-ray source and the detector are. A common way of speeding up powder diffraction measurements is the use of one- or two-dimensional detectors. These high resolution XRD allows phase identification, crystallinity determination, structures and texture of materials study. The Bragg-Brentano parafocusing configuration is currently the most widely used and is therefore briefly described here. The powder diffractometer used in our study was set up in a Bragg-Brentano geometry (see fig. providing a line focus divergent X-ray beam in Bragg-Brentano geometry. Fully computer controlled alignment system allows users easily operate this x-ray diffraction system with different measurement mode. Powder XRD is mainly used for structural analysis of microcrystalline solid. The system incorporates a high-resolution θ/θ closed loop goniometer drive system with an available in-plane and out-of-plane diffraction measurement. There are two primary optical modes that diffractometers can be configured in: BraggBrentano optics and Parallel Beam optics. This XRD system is equipped with 9 kW rotating anode X-ray source (λ~1.54Å) coupling with high-quality semiconductor detector that supports 0D, 1D or 2D x-ray diffraction measurement.
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